British Universities Film & Video Council

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Using Modeling to Resolve Design and Reliability Issues

Synopsis
A video recording of a short course held by the Electron Devices Meeting in 2000. This course provides an overview of MOS and bipolar devices, circuit models and reliability physics. The course describes the operation and design issues of Si integrated circuits, points out applications and discusses the process integration, reliability and testing issues.

Contents :
TOPICS: Semiconductor physics and p-n junction models; MOS capacitance-voltage modeling; MOSFET current-voltage behavior: SPICE type circuit models; MOSFET short channel effects: DIBL, GIDL, charge sharing, velocity overshoot, quantum-mechanical models; Bipolar junction transistor models: Hybrid-pi, Ebers-Moll and Gummel-Poon; BJT second order effects: Early, Kirk, Webster, breakdown, HBTs; Reliability Issues in Si ICs: Hot carriers, latchup, gate oxide integrity, electromigration, electrostatic discharge
Series
Vanguard, Series
Language
English
Country
United States
Year of release
2001
Year of production
2000
Subjects
Information technology
Keywords
circuit design; electronic engineering; microelectronic devices; modelling - engineering; reliability; semiconductors

Distribution Formats

Type
VHS
Format
PAL
Price
$360.00
Availability
Sale
Duration/Size
405 minutes
Year
2003

Sponsor

Name

IEEE Electron Devices Society

Distributor

Name

Institute of Electrical and Electronic Engineers Inc

Email
customer-service@ieee.org
Web
http://www.ieee.org/organizations/eab/ceus/ssvideo.htm External site opens in new window
Phone
+1 908 562 5493
Address
445 Hoes Lane
PO Box 1331
Piscataway
NJ 08855-1331
USA

Record Stats

This record has been viewed 338 times.