Testing and Design for Testability
- Synopsis
- Teaching and learning material covering an understanding and appreciation of how to apply the principles and established procedures for testing and designing testable electronic systems, and the concept of testing and design for testability being as integral as the design process as considerations regarding performance and functionality. Offers an overview of circuit failure modes, the testing process and types of automatic test equipment (ATE) and methods for automatic test pattern generation (ATPG), fault modelling and fault simulation. Design for testability techniques. For use to complement traditional methods of teaching and learning. Comprises approximately 30 hours of teaching material.
- Series
- Edec: A Computer-Based Teaching System for Electronic Design Education, Tltp Project
- Language
- English
- Country
- Great Britain
- Year of production
- 1995
- Availability
- Free (from server)
- Notes
- Available to UK higher education institutions.
- Uses
- Advancedlevel electrical and electronic engineering and computer science courses.
- Subjects
- Engineering
- Keywords
- computer science; electrical and electronic engineering; engineering design; engineering teaching; Teaching & Learning Technology Programme; testing
Distributor
- Name
UMIST, Department of Electrical Engineering and Electronics
- Phone
- 0161-200 4702
- Fax
- URL: http:/edec.ee.umist.ac.uk
- Address
- PO Box 88
Manchester
M60 1QD - Notes
- contact: Professor Peter J Hicks, EDEC TLTP Project
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